Note: We will be attending the MM25 Conference in Salt Lake City from July 27–31, 2025. Visit us at booth 1230.

Our Flagship Product: MIRA

MIRA Large Chamber SEM Interior

MIRA - Large Chamber Scanning Electron Microscope (LC-SEM)

MIRA, the Large Chamber Scanning Electron Microscope (LC-SEM) by Ellcie, is engineered to "Expand Your View" in materials science. It stands as the ultimate tool for non-destructive testing, ingeniously overcoming the sample size limitations inherent in traditional SEMs.

Accommodating specimens up to 1500mm in diameter and weighing up to 300kg, MIRA enables the direct analysis of large, intact components. Its advanced design supports in-situ studies, including unique fatigue testing capabilities within the vacuum chamber, providing critical insights for industries from aerospace and automotive to archaeology and materials research.

Unmatched Specimen Capacity

Accommodates samples up to 1500mm in diameter and 1500mm in height (300kg max), allowing direct analysis of large components without destructive sectioning.

High-Resolution Imaging & Precision

Delivers better than 10nm resolution with magnification up to 300,000x, supported by an active damping system for exceptionally stable and clear imaging.

Advanced In-Situ & Extended View

Patented 5+1 axis positioning system enables "walking around the sample." Uniquely offers fatigue testing and other in-situ experiments within the SEM.

Comprehensive Analytical Suite

Integrates standard EDS and EBSD, with versatile options for Focus Ion Beam (FIB), FT-IR, and an internal camera system for thorough material characterization.

MIRA Technical Specifications

Feature Specification
Resolution Better than 10nm
Magnification 10x - 300,000x
Acceleration Voltage 0.2 - 30keV
Detectors Channeltron for secondary electrons (SE), 4-Quadrant for backscattered electrons (BSE)
Maximum Specimen Size Up to 1500 mm diameter, 1500 mm height
Maximum Specimen Mass 300 kg
Axes Control 5+1 axis system with micro-step control
Repetition Accuracy ±50 μm
Positioning Range (X-axis) Options based on chamber size (e.g., 600mm, 1000mm, 1500mm travel)
Positioning Range (Z-axis) Base 600mm, with options for larger travel based on chamber size
Positioning Range (A-axis) 90° (e.g., ±45°)
Positioning Range (B-axis) 135°
Positioning Range (C-axis) 360°
Positioning Range (D-axis) 350°
Standard Analytical Systems Energy Dispersive X-Ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD)
Optional Analytical/Imaging Systems Focus Ion Beam (FIB), Fourier Transformed Infrared Spectrometer (FT-IR), Internal Camera System
Control Software MIRA Control System (Microsoft Windows® based), 100% Computer Controlled
Hardware PC, monitors, Printer
Low Vacuum Pumps Rotary vane pump (65m³/h), Rotary lobe pump (400 m³/h)
High Vacuum Pump Turbo molecular pump (2400 l/sec)
Ultimate Vacuum Up to 10⁻⁶ mbar (achieved in approx. 45 minutes under standard conditions)
Vacuum Chamber Volume Options 3m³, 9m³, 12m³ (customizable)

Powering Innovation Across Industries

Advanced Manufacturing & Engineering (Automotive, Aerospace)

MIRA's large chamber and non-destructive capabilities are crucial for inspecting and analyzing large, complex components in automotive (e.g., engine blocks, soldered bonds) and aerospace, without damage or disassembly.

  • Non-destructive testing (NDT) for quality control on 100% of production parts.
  • In-situ analysis of material behavior under operational stress.
  • Failure analysis of critical components like turbine blades or powertrain parts.
  • Characterization of welds, bonds, coatings, and advanced composite materials.
  • Detailed inspection of large structures that cannot be sectioned.

Materials Science & Research and Development

A versatile tool for fundamental research, MIRA allows for in-depth investigation of material properties, new alloy development, and direct observation of dynamic processes such as deformation, fracture, and fatigue.

  • In-situ observation of deformation and failure mechanisms in real-time.
  • Development and characterization of novel materials, alloys, and coatings.
  • Integrated fatigue testing inside MIRA for direct observation of crack initiation and propagation.
  • Interrupted monitoring experiments to study wear, corrosion, and damage processes.
  • Advanced research into material microstructures, phase transformations, and crystal orientation (EBSD).

Specialized Component Analysis (Electronics, Medical, Forensics)

For high-value, sensitive, or unique samples, MIRA offers detailed analysis without destruction. This is essential in semiconductor manufacturing, medical device development, and forensic science.

  • Non-destructive inspection of semiconductor devices, PCBs, and electronic components.
  • Analysis of medical implants, biomaterials, and pharmaceutical delivery systems.
  • Detailed forensic examination of evidence, preserving sample integrity.
  • Quality assurance for precision-engineered optical and mechanical components.
  • Surface characterization of sensitive materials at high resolution.

Cultural Heritage & Archaeology

MIRA provides an invaluable, non-invasive method for studying irreplaceable archaeological artifacts and cultural heritage items, revealing their composition, construction, and history without causing harm.

  • Non-destructive analysis of large and delicate historical artifacts.
  • Material identification for provenance studies and authenticity verification.
  • Assessment of conservation treatments and understanding degradation mechanisms.
  • Detailed imaging and elemental analysis of objects previously too large for SEM study.
  • Revealing hidden details and manufacturing techniques of ancient objects.

Interactive 3D MIRA Model

Ever wondered what a Large Chamber SEM looks like up close? Now you can (digitally) spin it! Go ahead, 3D print this mini-MIRA and let the micro-inspections begin on your desk!

Loading 3D Model...
Download MIRA .STL Model

About ELLCIE Industries

About image

Founded by Martin Klein, ELLCIE Industries GmbH has established itself as a leader in advanced microscopy solutions for the most demanding applications in space exploration and defense technology.

Our state-of-the-art production facility in Grevesmühlen, Germany, combines German engineering precision with cutting-edge innovation to deliver unparalleled analytical capabilities.

Technical Expertise

World-class team of engineers and scientists specializing in vacuum technology and electron microscopy.

Innovation Focus

Continuous R&D to push the boundaries of non-destructive testing and materials analysis.

Contact Us

Get in Touch

Our Location

ELLCIE Industries Gesellschaft mit beschränkter Haftung

Grüner Weg 6

23936 Grevesmühlen

Deutschland

Phone

03881-755400

Email

info@ellcie.com

Click below to load the interactive map. Loading the map will share data with Google.